Equipment
for Observation and Analysis

 
Equipment Performance list
Reaction Science high-voltage scanning transmission electron microscop | JEM-1000K RS

Reaction Science high-voltage scanning transmission electron microscope
JEM-1000K RS

  • In situ observation in reaction gas environment
  • Analysis of electronic state
  • Observation of thick materials
  • Electron beam computer tomography
  • Equipped with EELS
Chromosome stereoscopic constriction images of cells cultured from rat kidneys
Oxidation process of tin particles in oxygen at elevated temperature atmosphere
Atomic level high-resolution observation of silicon carbide (SiC)
Multivariate analysis to separate spectral components for mapping of each chemical state from spectrum image data
  Performance list  
Aberration corrected scanning transmission electron microscope | EM-10000BU

Aberration corrected scanning transmission electron microscope EM-10000BU

  • High-resolution observation/analysis equipment for experienced users
  • Equipped with EDS/EELS
High-resolution observation of gold particles
Atomic level high-resolution observation of graphene six-membered ring structure
  Performance list  
Transmission Electron Microscope | JEM-2100plus

Transmission Electron Microscope JEM-2100plus

  • General observation/analysis equipment for beginners
  • Equipped with EDS
Silicon [111] electron diffraction pattern
Stainless steel transition/stereo image
  Performance list  
High-speed sample fabrication/analysis system MI4000L

High-speed sample fabrication/analysis system
MI4000L

  • Equipped with EDS/EELS
3-dimensional IPF mapping of iron materials
  
  Performance list  

High resolution analytical scanning transmission electron microscope
JEM-2100F HK

  • High-resolution observation/analysis equipment for advanced users
  • Equipped with EDS

Ultra high resolution analytical scanning transmission electron microscope
JEM-ARM 200F Cold

  • High-resolution observation/analysis equipment for experienced users
  • Equipped with EDS/EELS

Scanning Electron Microscope
JSM-6610 A

  • General observation/analysis equipment for beginners
  • Equipped with EDS


High speed FIB-SEM system for bio/inorganic materials
ETHOS NX5000

  • Processing/observation/analysis equipment for beginners ~ experienced users
  Performance list  

Sample processing equipment
For Fablication

 

Focused Ion beam machining apparatus
JEM-9320FIB

  • Processing equipment for beginners
  • Equipped with electron beam lithography function

Focused Ion beam machining apparatus
FB-2100

  • Processing equipment for beginners
  • Equipped with built-in micro-sampling function

High-speed sample fabrication/analysis system
MI-4000L

  • Processing/observation/analysis equipment for advanced users
  • Equipped with built-in micro-sampling function


Network of ion milling devices

Device for lapping and ion milling specimens for planar and cross sectional TEM observation

Electrolytic polishing device

Device for preparing metal or metal alloy specimens by electrolytic polishing for TEM observation

Diamond wire saw

Cutting of micro size pieces from bulk


High speed FIB-SEM system for bio/inorganic materials
ETHOS NX5000

  • Processing/observation/analysis equipment for beginners ~ experienced users
  Performance list  

Analysis software
For Data Analysis

 

3D construction software Avizo Fire
 

Reconstruction of 3D images from multi-slice images

3D construction software
Composer & Visualizer-Kai

Reconstruction of 3D images from continuously inclined images

High-resolution TEM image simulation analysis software
MacTempus/CrystalKit

TEM image simulation and crystal structure construction
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Nagoya UniversityHigh Voltage Electron Microscope Laboratory, Institute of Materials and Systems for Sustainability, Nagoya University.
〒464-8603 Furo-cho, Chikusa-ku, Nagoya, JAPAN Tel：+81-52-789-3631